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聚焦离子束铣削和脑组织的扫描电子显微镜
JoVE Journal
Neuroscience
This content is Free Access.
JoVE Journal
Neuroscience
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
Please note that all translations are automatically generated.
Click here for the English version.
聚焦离子束铣削和脑组织的扫描电子显微镜
DOI:
10.3791/2588-v
•
08:57 min
•
July 06, 2011
•
Graham Knott
,
Stéphanie Rosset
,
Marco Cantoni
1
Centre of interdisciplinary electron microscopy
,
École Polytechnique Fédérale de Lausanne
Chapters
00:05
Title
01:29
Sample Fixation and Resin Embedding
04:00
Preparing the Sample for the FIB/SEM
05:55
Imaging the FIB/SEM
08:03
Results: FIB/SEM Images of Brain Tissue
08:40
Conclusion
Summary
Automatic Translation
English (Original)
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Automatic Translation
这个协议描述树脂嵌入脑组织如何准备和聚焦离子束在三个层面成像,扫描电子显微镜。
Tags
Focussed Ion Beam Milling
Scanning Electron Microscopy
FIB/SEM Protocol
Aldehydes Fixation
Heavy Metal Staining
Osmium Tetroxide
Uranyl Acetate
Dehydration
Resin Infiltration
Ultramicrotome
Glass Knives
Block Preparation
Vertical Face Milling
Backscattered Electron Imaging
Serial Imaging
Isotropic Voxels
Cell Ultrastructure Analysis
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